ME 5330 :
EM of Nanomaterials

Fundamental theories of scanning electron microscopy, energy dispersive spectrometer, and nanomaterials; operating principles for Hitachi S-4800 high resolution scanning electron microscope; hands-on experiences on secondary and backscattering images, x-ray microanalysis and characterization of nanomaterials. Limited to 15 students/seats.

Overview

Program

Credits

Credits 3

Last Offered

Spring 2010, Fall 2008